Table 1. | Semi-quantitative XPS analysis of the Ti implants (at %) |
| C 1s | O 1s | Ti 2p | Al 2p | N 1s | Si 2p | F 1s | P 2p | Ca 2p | |
|---|---|---|---|---|---|---|---|---|---|
| Implant I | 45.13 (3.47) | 35.74 (2.21) | 8.28 (0.72) | 5.13 (0.72) | 3.14 (0.29) | 1.36 (0.15) | 0.55 (0.08) | 0.50 (0.07) | 0.17 (0.03) |
| Implant II | 60.66 (7.40)a | 26.79 (4.93) | 8.06 (1.86) | 1.02 (0.56)a | 1.79 (0.22)a | 0.75 (0.15)a | 0.21 (0.06)a | 0.18 (0.02)a | 0.56 (0.16)a |
aSignificantly different from Implant I (P ≤ 0.05).
|